Message for the 4th International Symposium on the Bi-Digital O-Ring Test in Japan

Ken Hayashibara

President and CEO Hayashibara Co., Ltd.

Honorary Member, Japan Bi-Digital O-Ring Test Association

 I would like to take this opportunity to extend my heartfelt congratulations on the grand opening of the 4th International Symposium on the Bi-Digital O-Ring Test. Mr. Masaru Ibuka, former chairman of Sony put his heart and soul for a long time to popularize the O-Ring test method, developed by Prof. Omura. His untimely demise without fulfilling his intentions, was a great loss not only for Japan but also for the propagation of O-ring technology.

 I am happy to note that many people in the Bi-Digital O-Ring Test Association feel about O-Ring Test Method in the same way as did Mr. Ibuka and are following in his foot steps to propagate this technology.

I sincerely hope that with Prof. Omura as a central figure we all will join forces and with unreserved cooperation among each other, will spread O-Ring Test Method with an aim to develop it as the most advanced technology for preventive medicine.

 I am one of those who wish and would like to see this O-Ring technology as one of the most advanced technologies of the 21st century.

 It will be an honor for our group to extend whatever cooperation is possible on our part. I have full confidence that this symposium will be the first step towards our goal and with this I would like to close my congratulatory greetings.